230000015654 memory Effects 0.000 title claims abstract description 550.Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Priority to US62939504P priority Critical Priority to US60/629,395 priority Priority to US73349305P priority Priority to US60/733,493 priority Application filed by Mentor Graphics Corporation filed Critical Mentor Graphics Corporation Publication of WO2006055862A2 publication Critical patent/WO2006055862A2/en Publication of WO2006055862A3 publication Critical patent/WO2006055862A3/en Links ( en Inventor Nilanjan Mukherjee Xiaogang Du Wu-Tung Cheng Original Assignee Mentor Graphics Corporation Priority date (The priority date is an assumption and is not a legal conclusion. Google Patents WO2006055862A2 - Programmable memory built-in-self-test (mbist) method and apparatus
WO2006055862A2 - Programmable memory built-in-self-test (mbist) method and apparatus